Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

by Patrick Echlin
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Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen.

The two instruments generally operate in a high vacuum and a very dry environment in order to pr.

First published
2009
Publishers
Springer
Language
English

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